Fullerene layers molecular beam epitaxially grown on, a vanadium-selenide substrate are investigated and the morphology of the layered structures is studied. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of certain layers is analyzed by a box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimensions. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations. © 2009 Elsevier Ltd. All rights reserved.